Joseph Goldstein – författare
Visar alla böcker från författaren Joseph Goldstein. Handla med fri frakt och snabb leverans.
33 produkter
33 produkter
Häftad, Engelska, 2024
220 kr
Häftad, Engelska, 2016
249 kr
Skickas inom 3-6 vardagar
The mind contains the seeds of its own awakening—seeds that we can cultivate to bring forth the fruits of a life lived consciously. With Mindfulness, Joseph Goldstein shares the wisdom of his four decades of teaching and practice in a book that will serve as a lifelong companion for anyone committed to mindful living and the realization of inner freedom. Goldstein’s source teaching is the Satipa??hana Sutta, the Buddha’s legendary discourse on the four foundations of mindfulness that became the basis for the many types of Vipassana (or insight meditation) found today. Exquisite in detail yet wholly accessible and relevant for the modern student, Mindfulness takes us through a profound study of:• Mindfulness of body, including the breath, postures, activities, and physical characteristics• Mindfulness of feelings—how the experience of our sense perceptions influences our inner and outer worlds• Mindfulness of mind—learning to recognize skillful and unskillful states of mind and thought• Mindfulness of dhammas (or categories of experience), including the Five Hindrances, the Six Sense Spheres, and the Seven Factors of Awakening"There is a wealth of meaning and nuance in the experience of mindfulness that can enrich our lives in unimagined ways," writes Goldstein. In Mindfulness you have the tools to mine these riches for yourself.
Häftad, Engelska, 1971
200 kr
Skickas inom 5-8 vardagar
This selection of readings intends to discuss notable literature surrounding the world of criminal law, including the impact of the United States Supreme Court and the development of the codification movement.Crime Law and Society works to takes readers into the literature of the purposes of criminal law, its processes, and the interrelation of purpose and process. The editors of these selections strive to emphasis the research and writings that have caught their attention in order to promote discourse and discussion among professionals and general readers.
Häftad, Engelska, 1984
162 kr
Skickas inom 5-8 vardagar
Beyond the Best Interests of the Child is the first volume in a classic trilogy of works by Joseph Goldstein, former Sterling Professor Emeritus of Law at Yale Law School; Albert J. Solnit, the former director of the Yale Child Study Center, and Anna Freud, daughter of Sigmund Freud. This collection of texts are classic references often cited in child custody cases. Rather than the familiar legal "best interests of the child" doctrine, the authors’ work is based on the more realistic standard of finding the "least detrimental alternative." This is indispensable reading for social workers, family court judges, lawyers, psychologists, and parents.
Häftad, Engelska, 1986
202 kr
Skickas inom 5-8 vardagar
The second volume in a classic trilogy of works by Joseph Goldstein, former Sterling Professor Emeritus of Law at Yale Law School; Albert J. Solnit, the former director of the Yale Child Study Center, and Anna Freud, daughter of Sigmund Freud. These texts (Beyond the Best Interests of the Child was the first in the series, and In the Best Interests of the Child was the third) are classic references often cited in child custody cases; Before the Best Interests of the Child specifically addresses when the state should intervene. Rather than the familiar legal "best interests of the child" doctrine, the authors’s work is based on the more realistic standard of finding the "least detrimental alternative." This is indispensable reading for social workers, family court judges, lawyers, psychologists, and parents.
Inbunden, Engelska, 1986
1 869 kr
Skickas inom 10-15 vardagar
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
Inbunden, Engelska, 1986
1 602 kr
Skickas inom 10-15 vardagar
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
Häftad, Engelska, 1990
1 065 kr
Skickas inom 5-8 vardagar
During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.
Inbunden, Engelska, 1995
2 135 kr
Skickas inom 10-15 vardagar
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy sis-still used in conjunction with a gas counter.
Inbunden, Engelska, 2003
1 178 kr
Skickas inom 10-15 vardagar
This text provides students as well as practitioners - engineers, technicians, physical and biological scientists, clinicians and technical managers - with a comprehensive introduction to the field of scanning electron microscopy (SEM) and x-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron backscatter diffraction. Special topics in SEM include high resolution SEM, low voltage SEM, variable pressure and environmental SEM, SEM metrology, stereomicroscopy, particle microscopy and special contrast mechanisms. Special topics in x-ray microanalysis include thin film, particle, and rough surface analysis, analysis of beam sensitive materials including biologicals and polymers, and preparation of the analytical report.SEM and x-ray microanalysis sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A database of useful parameter for SEM and x-ray microanalysis calculations and enhancements to the text chapters are available on an accompanying CD.
Häftad, Engelska, 1998
206 kr
Skickas inom 5-8 vardagar
In The Best Interests of the Child, published between 1973 and 1986, the authors speak in one voice in concluding that the continuity of care - continuity of a child's relationship with his or her adult caregiver - is a universal essential to the child's well-being.The authors stress that minimizing intrusions by the law is paramount to safeguarding the child's growth and development. The least detrimental alternative - the authors overarching guideline for assuring the continuity of the psychological parent-child relationship - has been cited in more than a thousand child custody cases since 1973.
Häftad, Engelska, 2021
270 kr
Skickas inom 3-6 vardagar
Inbunden, Engelska, 2022
1 776 kr
Skickas inom 10-15 vardagar
Originally published in 1952, The Government of British Trade Unions analyses the government, in theory and in practice, of one of Britain’s most important labour organizations – The Transport and General Works Union in the first half of the 20th Century. It is an appraisal of the role of the rank and file within this union of over one million members, to determine both the opportunity for, and the extent of their participation in, this State within a State. Original sources and materials, which had not previously been made public in relation to any major British or American Trade Union, were used to ascertain member turnover, participation in elections, attendance at Branch meetings and the effect of the repeal of the Trade Disputes Act on Labour Party membership. The study is of great interest both for the light it throws on the general question of Trade Unions in the modern State, and for its analysis of the Transport and General Works Union itself.
Häftad, Engelska, 2024
446 kr
Skickas inom 10-15 vardagar
Originally published in 1952, The Government of British Trade Unions analyses the government, in theory and in practice, of one of Britain’s most important labour organizations – The Transport and General Works Union in the first half of the 20th Century. It is an appraisal of the role of the rank and file within this union of over one million members, to determine both the opportunity for, and the extent of their participation in, this State within a State. Original sources and materials, which had not previously been made public in relation to any major British or American Trade Union, were used to ascertain member turnover, participation in elections, attendance at Branch meetings and the effect of the repeal of the Trade Disputes Act on Labour Party membership. The study is of great interest both for the light it throws on the general question of Trade Unions in the modern State, and for its analysis of the Transport and General Works Union itself.
Häftad, Vietnamesiska, 2019
134 kr
Skickas inom 5-8 vardagar
Häftad, Engelska, 2011
1 071 kr
Skickas inom 10-15 vardagar
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
Engelska, 2013
625 kr
Skickas inom 5-8 vardagar
Häftad, Engelska, 2013
1 071 kr
Skickas inom 10-15 vardagar
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Häftad, Engelska, 2011
1 071 kr
Skickas inom 10-15 vardagar
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
Häftad, Engelska, 2013
1 083 kr
Skickas inom 5-8 vardagar
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.
Häftad, Engelska, 2012
2 135 kr
Skickas inom 10-15 vardagar
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy sis-still used in conjunction with a gas counter.
Häftad, Engelska, 2013
1 103 kr
Skickas inom 10-15 vardagar
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
Engelska, 2013
625 kr
Skickas inom 5-8 vardagar
Häftad, Engelska, 2013
1 403 kr
Skickas inom 3-6 vardagar
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
Häftad, Vietnamesiska, 2017
163 kr
Skickas inom 5-8 vardagar
Häftad, Vietnamesiska, 2017
187 kr
Skickas inom 5-8 vardagar
Häftad, Engelska, 2018
106 kr
Skickas
Häftad, Engelska, 2020
185 kr
Skickas
Inbunden, Engelska, 2017
225 kr
Skickas inom 7-10 vardagar
Häftad, Engelska, 2024
185 kr
Skickas