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J. A. A. W. Elemans, Journal of Applied Crystallography The book Introduction to Scanning Tunneling Microscopy by C. Julian Chen serves as an excellent starting point to familiarize newcomers with the field, and at the same time provides an in-depth account of theoretical and practical aspects of SPM for the more experienced user. In my personal experience it is also very useful as a textbook for teaching single-molecule studies, at both the beginners and the advanced level.
C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York, USA. Please visit the author's homepage for more information. [add URL as in the HB webpage: http://www.columbia.edu/~jcc2161/]
1. Overview ; PART I ; PRINCIPLES ; 2. Tunneling Phenomena ; 3. Tunneling Matrix Elements ; 4. Atomic forces ; 5. Atomic Forces and Tunneling ; 6. Nanometer-Scale Imaging ; 7. Atomic-Scale Imaging ; 8. Nanomechanical Effects ; PART II ; INSTRUMENTATION ; 9. Piezoelectric Scanners ; 10. Vibration Isolation ; 11. Electronics and Control ; 12. Mechanical Design ; 13. Tip Treatment ; 14. Scanning Tunneling Spectroscopy ; 15. The Atomic Force Microscope ; 16. Illustrative Applications ; APPENDICES ; A. Green's Functions ; B. Spherical Modified Bessel Functions ; C. Surface symmetry ; D. Elementary elasticity theory