Progress in Transmission Electron Microscopy 2 (häftad)
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Format
Häftad (Paperback / softback)
Språk
Engelska
Antal sidor
307
Utgivningsdatum
2010-10-19
Upplaga
Softcover reprint of hardcover 1st ed. 2001
Förlag
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Medarbetare
Zhang, Xiao-Feng
Illustrationer
XIV, 307 p.
Volymtitel
2
Dimensioner
234 x 156 x 18 mm
Vikt
459 g
Antal komponenter
1
Komponenter
1 Paperback / softback
ISBN
9783642087189

Progress in Transmission Electron Microscopy 2

Applications in Materials Science

av Xiao-Feng Zhang, Ze Zhang
Häftad,  Engelska, 2010-10-19
1677
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Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
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Innehållsförteckning

1. The Guidance Role of HRTEM in Developing Mesoporous Molecular Sieves.- 2. HREM Study of Carbon Nanoclusters Grown from Carbon Arc-Discharge.- 3. Determining the Helicity of Carbon Nanotubes by Electron Diffraction.- 4. Low-Dimensional Materials and their Microstructures Studied by High-Resolution Electron Microscopy.- 5. Microstructure of High-Tc Superconducting Josephson Junctions.- 6. Swift Heavy Ion Irradiation Damage in Superconductors.- 7. TEM Investigations of Misfit Dislocations in Lattice-Mismatched Semiconductor Heterostructures.- 8. Dislocated Contrast Analysis.- 9. Transmission Electron Cryomicroscopy and Three-Dimensional Reconstruction of Macromolecular Complexes.

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