Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists
AvJoseph Goldstein,Dale E. Newbury
634 kr
Beställningsvara. Skickas inom 5-8 vardagar. Fri frakt över 249 kr.
Produktinformation
- Utgivningsdatum:2013-06-02
- Format:Övrigt
- Språk:Engelska
- Antal sidor:692
- Förlag:Springer
- ISBN:9781461332749
Mer från samma författare
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
1 854 kr
Principles of Analytical Electron Microscopy
Joseph Goldstein, David C. Joy, Alton D. Romig Jr.
1 589 kr
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters
1 057 kr
X-Ray Spectrometry in Electron Beam Instruments
Joseph Goldstein, Dale E. Newbury, David B. Williams
2 117 kr
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
1 167 kr
Du kanske också är intresserad av
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
1 099 kr
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
1 094 kr
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
1 167 kr
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
1 854 kr
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters
1 057 kr
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin
1 062 kr
X-Ray Spectrometry in Electron Beam Instruments
Joseph Goldstein, Dale E. Newbury, David B. Williams
2 117 kr
X-Ray Spectrometry in Electron Beam Instruments
Joseph Goldstein, Dale E. Newbury, David B. Williams
2 117 kr
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
1 062 kr
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
1 098 kr