Patrizia Ciarlini - Böcker

This workshop should interest researchers and others involved with high-precision measurements and the development of mathematical tools for this purpose. Advances in metrology depend on improvements in scientific and technical knowledge, the quality of instruments, a better use of advanced mathematical tools and the development of new ones. A tradition of close co-operation between metrologists and mathematicians, while found elsewhere, is lacking in Italy. This workshop wishes to start such a co-operation by providing a common meeting ground. Several industrial sectors, particularly those of instrumentation and software, are likely to benefit from this process, since metrology has a high impact on the overall quality of industrial products and applied mathematics is becoming increasingly important in industrial processes.

This book is of interest to researchers in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to whoever is working in the development of these mathematical tools. Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality as well in a better use of advanced mathematical tools and in the development of new ones. In this book scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products and applied mathematics is becoming more and more important in industrial processes.

Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.

Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and also to those developing such mathematical tools.

This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology.The proceedings have been selected for coverage in:Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings — Engineering & Physical Sciences