Wei-Kan Chu – författare

Backscattering Spectrometry reviews developments in backscattering spectrometry and covers topics ranging from instrumentation and experimental techniques to beam parameters and energy loss measurements. Backscattering spectrometry of thin films is also considered, and examples of backscattering analysis are given. This book is comprised of 10 chapters and begins with an introduction to backscattering spectrometry, what it can and what it cannot accomplish, and some ""rules of thumb"" for interpreting or reading spectra. The relative strengths and weaknesses of backscattering spectrometry in the framework of materials analysis are outlined. The following chapters focus on kinematics, scattering cross sections, energy loss, and energy straggling; backscattering analysis of thin films of various degrees of complications; the influence of beam parameters; and mass and depth resolutions and their relationships to the mass and energy of projectiles. Many examples of backscattering analysis are also presented to illustrate the capability and limitation of backscattering. Backscattering applications when combined with channeling effects are considered as well. The final chapter provides a list of references on the applications of backscattering spectrometry. This monograph will be a useful resource for physicists.

The purpose of this Workshop was to define the current and future material needs for both scientific and technological purposes.

The workshop focussed on issues related to Bulk Processing and Applications, Structure and Flux Pinning as well as Thin Films. These issues are currently very critical to the development of these superconductors.Fifty-two papers authored by researchers from the United States and Japan were presented at the workshop. They reflect the state of the field in high-Tc superconductors and the direction in which the technology in these superconductors is moving. The papers also make accessible to interested scientists and engineers extremely valuable information on the progress achieved in applications in recent years.