Machine Learning Support for Fault Diagnosis of System-on-Chip
Patrick Girard, Shawn Blanton, Li-C. Wang
Inbunden
904 kr
Machine Learning Support for Fault Diagnosis of System-on-Chip
AvPatrick Girard,Shawn Blanton
Engelska, 2023
634 kr
Beställningsvara. Skickas inom 5-8 vardagar. Fri frakt över 249 kr.
Produktinformation
Hoppa över listan
Du kanske också är intresserad av
Machine Learning Support for Fault Diagnosis of System-on-Chip
Patrick Girard, Shawn Blanton, Li-C. Wang
Häftad
640 kr
Advanced Test Methods for SRAMs
Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Häftad
1 091 kr
Power-Aware Testing and Test Strategies for Low Power Devices
Patrick Girard, Nicola Nicolici, Xiaoqing Wen
Häftad
1 167 kr
Del 351
Power-Aware Testing and Test Strategies for Low Power Devices
Patrick Girard, Nicola Nicolici, Xiaoqing Wen
Inbunden
1 589 kr
Advanced Test Methods for SRAMs
Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Inbunden
1 062 kr