Patrick Girard – författare

Is logic a good tool for making decisions? Can it make us better listeners and help us find coherence in views that we disagree with? Is Sherlock Holmes actually good at logic?

Patrick Girard addresses these and other questions by presenting logic as the guardian of coherence. Logic, Girard argues, finds coherence in the patterns of reasoning across science, religion, and everyday decision making. It helps communities engage safely by replacing contentious debates with shared, constructive reasoning – logic provides neutral ground for the healthy pursuit of common goals and interests. Logic in the Wild employs common sense language, eschewing technical jargon, symbols, and equations. Girard’s attention focuses on logic’s power to find what unites the complex and the simple, the abstract and the concrete, the theoretical and the practical.

In treating logic not as a passive subject to learn but as an active discipline to engage with, Logic in the Wild teaches us to identify patterns in our own reasoning, which inevitably helps us better confront questions central to everyday life.

Is logic a good tool for making decisions? Can it make us better listeners and help us find coherence in views that we disagree with? Is Sherlock Holmes actually good at logic?

Patrick Girard addresses these and other questions by presenting logic as the guardian of coherence. Logic, Girard argues, finds coherence in the patterns of reasoning across science, religion, and everyday decision making. It helps communities engage safely by replacing contentious debates with shared, constructive reasoning – logic provides neutral ground for the healthy pursuit of common goals and interests. Logic in the Wild employs common sense language, eschewing technical jargon, symbols, and equations. Girard’s attention focuses on logic’s power to find what unites the complex and the simple, the abstract and the concrete, the theoretical and the practical.

In treating logic not as a passive subject to learn but as an active discipline to engage with, Logic in the Wild teaches us to identify patterns in our own reasoning, which inevitably helps us better confront questions central to everyday life.

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.

This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.