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Nicola Nicolici – författare

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6 produkter

  1. Bashir M. Al-Hashimi, Nicola Nicolici - Power-Constrained Testing of VLSI Circuits, E-bok. Tillgänglighet: Lägg i varukorg

    Power-Constrained Testing of VLSI Circuits

    A Guide to the IEEE 1149.4 Test Standard

    Av Bashir M. Al-Hashimi, Nicola Nicolici

    E-bok, 2006

    1459 kr

    Lägg i varukorg

    Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power …

  2. Nicola Nicolici, Bashir M. Al-Hashimi - Power-Constrained Testing of VLSI Circuits, Inbunden. Tillgänglighet: Lägg i varukorg

    Power-Constrained Testing of VLSI Circuits

    A Guide to the IEEE 1149.4 Test Standard

    Av Nicola Nicolici, Bashir M. Al-Hashimi

    Inbunden, 2003

    1096 kr

    Lägg i varukorg

    Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power …

  3. Patrick Girard, Nicola Nicolici, Xiaoqing Wen - Power-Aware Testing and Test Strategies for Low Power Devices, Inbunden. Tillgänglighet: Lägg i varukorg

    Power-Aware Testing and Test Strategies for Low Power Devices

    Av Patrick Girard, Nicola Nicolici m. fl.

    Inbunden, 2009

    1641 kr

    Lägg i varukorg

    Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power …

  4. Xiaoqing Wen, Nicola Nicolici, Patrick Girard - Power-Aware Testing and Test Strategies for Low Power Devices, E-bok. Tillgänglighet: Lägg i varukorg

    Power-Aware Testing and Test Strategies for Low Power Devices

    Av Xiaoqing Wen, Nicola Nicolici m. fl.

    E-bok, 2010

    1570 kr

    Lägg i varukorg

    Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power …

  5. Nicola Nicolici, Bashir M. Al-Hashimi - Power-Constrained Testing of VLSI Circuits, Häftad. Tillgänglighet: Lägg i varukorg

    Power-Constrained Testing of VLSI Circuits

    A Guide to the IEEE 1149.4 Test Standard

    Av Nicola Nicolici, Bashir M. Al-Hashimi

    Häftad, 2010

    1096 kr

    Lägg i varukorg

    Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power …

  6. Patrick Girard, Nicola Nicolici, Xiaoqing Wen - Power-Aware Testing and Test Strategies for Low Power Devices, Häftad. Tillgänglighet: Lägg i varukorg

    Power-Aware Testing and Test Strategies for Low Power Devices

    Av Patrick Girard, Nicola Nicolici m. fl.

    Häftad, 2014

    1205 kr

    Lägg i varukorg

    Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power …