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Shawn Blanton – författare

Visar alla böcker från författaren Shawn Blanton. Handla med fri frakt och snabb leverans.

4 produkter

  1. Patrick Girard, Shawn Blanton, Li-C. Wang - Machine Learning Support for Fault Diagnosis of System-on-Chip, Inbunden. Tillgänglighet: Lägg i varukorg

    Machine Learning Support for Fault Diagnosis of System-on-Chip

    Av Patrick Girard, Shawn Blanton m. fl.

    Inbunden, 2023

    933 kr

    Lägg i varukorg

    This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer …

  2. Li-C. Wang, Shawn Blanton, Patrick Girard - Machine Learning Support for Fault Diagnosis of System-on-Chip, E-bok. Tillgänglighet: Lägg i varukorg

    Machine Learning Support for Fault Diagnosis of System-on-Chip

    Av Li-C. Wang, Shawn Blanton m. fl.

    E-bok, 2023

    897 kr

    Lägg i varukorg

    This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer …

  3. Patrick Girard, Shawn Blanton - Machine Learning Support for Fault Diagnosis of System-on-Chip. Tillgänglighet: Lägg i varukorg

    Machine Learning Support for Fault Diagnosis of System-on-Chip

    Av Patrick Girard, Shawn Blanton

    2023

    667 kr

    Lägg i varukorg

  4. Patrick Girard, Shawn Blanton, Li-C. Wang - Machine Learning Support for Fault Diagnosis of System-on-Chip, Häftad. Tillgänglighet: Lägg i varukorg

    Machine Learning Support for Fault Diagnosis of System-on-Chip

    Av Patrick Girard, Shawn Blanton m. fl.

    Häftad, 2024

    660 kr

    Lägg i varukorg

    This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer …