Alberto Bosio – författare

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.

This book serves as a single-source reference to the latest advances in Approximate Computing (AxC), a promising technique for increasing performance or reducing the cost and power consumption of a computing system. The authors discuss the different AxC design and validation techniques, and their integration. They also describe real AxC applications, spanning from mobile to high performance computing and also safety-critical applications.  

This book introduces the concept of approximate computing for software and hardware designs and its impact on the reliability of embedded systems. It presents approximate computing methods and proposes approximate fault tolerance techniques applied to programmable hardware and embedded software to provide reliability at low computational costs. The book also presents fault tolerance techniques based on approximate computing, thus presenting how approximate computing can be applied to safety-critical systems.