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F.P.M. Beenker – författare

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3 produkter

  1. F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen - Testability Concepts for Digital ICs, Inbunden. Tillgänglighet: Lägg i varukorg

    Testability Concepts for Digital ICs

    The Macro Test Approach

    Av F.P.M. Beenker, R.G. Bennetts m. fl.

    Inbunden, 1995

    1635 kr

    Lägg i varukorg

    This volume considers testability aspects for digital ICs. The strategy taken is to integrate the testability aspects into the design and manufacturing of ICs and, for each IC design project, to give a precise definition of the boundary conditions, responsibilities, interfaces and communications …

  2. F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen - Testability Concepts for Digital ICs, Häftad. Tillgänglighet: Lägg i varukorg

    Testability Concepts for Digital ICs

    The Macro Test Approach

    Av F.P.M. Beenker, R.G. Bennetts m. fl.

    Häftad, 2012

    1643 kr

    Lägg i varukorg

    Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted …

  3. A.P. Thijssen, R.G. Bennetts, F.P.M. Beenker - Testability Concepts for Digital ICs, E-bok. Tillgänglighet: Lägg i varukorg

    Testability Concepts for Digital ICs

    The Macro Test Approach

    Av A.P. Thijssen, R.G. Bennetts m. fl.

    E-bok, 2012

    2111 kr

    Lägg i varukorg

    Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted …