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Nabil Shovon Ashraf – författare

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7 produkter

  1. Nabil Shovon Ashraf, Shawon Alam, Mohaiminul Alam - New Prospects of Integrating Low Substrate Temperatures with Scaling-Sustained Device Architectural Innovation, Häftad. Tillgänglighet: Lägg i varukorg

    New Prospects of Integrating Low Substrate Temperatures with Scaling-Sustained Device Architectural Innovation

    Av Nabil Shovon Ashraf, Shawon Alam m. fl.

    Häftad, 2016

    308 kr

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    In order to sustain Moore's Law-based device scaling, principal attention has focused on toward device architectural innovations for improved device performance as per ITRS projections for technology nodes up to 10 nm. Efficient integration of lower substrate temperatures (

  2. Nabil Shovon Ashraf - Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET, Häftad. Tillgänglighet: Lägg i varukorg

    Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET

    Av Nabil Shovon Ashraf

    Häftad, 2018

    366 kr

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    Low substrate/lattice temperature (< 300 K) operation of n-MOSFET has been effectively studied by device research and integration professionals in CMOS logic and analog products from the early 1970s. The author of this book previously composed an e-book in this area where he and his co-authors …

  3. Mohaiminul Alam, Shawon Alam, Nabil Shovon Ashraf - New Prospects of Integrating Low Substrate Temperatures with Scaling-Sustained Device Architectural Innovation, E-bok. Tillgänglighet: Lägg i varukorg

    New Prospects of Integrating Low Substrate Temperatures with Scaling-Sustained Device Architectural Innovation

    Av Mohaiminul Alam, Shawon Alam m. fl.

    E-bok, 2022

    395 kr

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    In order to sustain Moore''s Law-based device scaling, principal attention has focused on toward device architectural innovations for improved device performance as per ITRS projections for technology nodes up to 10 nm. Efficient integration of lower substrate temperatures (

  4. Nabil Shovon Ashraf - Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET, E-bok. Tillgänglighet: Lägg i varukorg

    Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET

    Av Nabil Shovon Ashraf

    E-bok, 2022

    447 kr

    Lägg i varukorg

    Low substrate/lattice temperature (< 300 K) operation of n-MOSFET has been effectively studied by device research and integration professionals in CMOS logic and analog products from the early 1970s. The author of this book previously composed an e-book in this area where he and his co-authors …

  5. Nabil Shovon Ashraf - Parameter-Centric Scaled FET Devices, Inbunden. Tillgänglighet: Lägg i varukorg

    Parameter-Centric Scaled FET Devices

    Physics Based Perspectives and Attributes

    Av Nabil Shovon Ashraf

    Inbunden, 2025

    435 kr

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    Parameters that determine the performance of silicon-based Field Effect Transistors (FET) devices in the presence of degenerate doping, often are not modeled properly and so require precise analysis to improve modeling accuracy. The book is focused on the extraction of parameters for silicon-based …

  6. Nabil Shovon Ashraf - Parameter-Centric Scaled FET Devices, E-bok. Tillgänglighet: Lägg i varukorg

    Parameter-Centric Scaled FET Devices

    Physics Based Perspectives and Attributes

    Av Nabil Shovon Ashraf

    E-bok, 2025

    571 kr

    Lägg i varukorg

    Parameters that determine the performance of silicon-based Field Effect Transistors (FET) devices in the presence of degenerate doping, often are not modeled properly and so require precise analysis to improve modeling accuracy. The book is focused on the extraction of parameters for silicon-based …

  7. Nabil Shovon Ashraf - Parameter-Centric Scaled FET Devices, Häftad. Tillgänglighet: Lägg i varukorg

    Parameter-Centric Scaled FET Devices

    Physics Based Perspectives and Attributes

    Av Nabil Shovon Ashraf

    Häftad, 2026

    437 kr

    Lägg i varukorg

    Parameters that determine the performance of silicon-based Field Effect Transistors (FET) devices in the presence of degenerate doping, often are not modeled properly and so require precise analysis to improve modeling accuracy. The book is focused on the extraction of parameters for silicon-based …