Modeling and Characterization of RF and Microwave Power FETs

AvPeter Aaen,Jaime A. Plá

Inbunden, Engelska, 2007

Del i serien The Cambridge RF and Microwave Engineering Series

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Beskrivning

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.

Produktinformation

Utgivningsdatum:2007-06-25
Mått:170 x 244 x 22 mm
Vikt:800 g
Format:Inbunden
Språk:Engelska
Serie:The Cambridge RF and Microwave Engineering Series
Antal sidor:380
Förlag:Cambridge University Press
ISBN:9780521870665

Utforska kategorier

Elektronik och kommunikationer inom Naturvetenskap och teknik

Mer om författaren

Peter H. Aaen is the Modeling Group Manager in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. Jaime A. Pia is the Design Organization Manager in the RF Division at Freescale in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. John Wood is Senior Technical Contributor responsible for RF CAD and Modeling in the RF Division at Freescale Semiconductor, Inc., Tempe, Arizona. He is a Fellow of the IEEE.

Recensioner i media

Review of the hardback: '… a well-written and useful text … a coherent review of the advanced state of power FET modelling and characterisation.' IEEE Microwave Magazine

Innehållsförteckning

1. RF and microwave power transistors; 2. An introduction to the compact modeling of high power FETs; 3. Electrical measurement techniques; 4. Passive components: simulation and modeling; 5. Thermal characterization and modeling; 6. Modeling the active transistor; 7. Function approximation for compact modeling; 8. Model implementation in CAD tools; 9. Model validation; About the authors; Index.