Digital Systems Testing and Testable Design

Inbunden, Engelska, 1994

2 107 kr

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Beskrivning

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Produktinformation

Utgivningsdatum:1994-09-13
Mått:186 x 258 x 42 mm
Vikt:1 361 g
Format:Inbunden
Språk:Engelska
Antal sidor:672
Förlag:John Wiley & Sons Inc
ISBN:9780780310629

Utforska kategorier

Elektronik och kommunikationer inom Naturvetenskap och teknik

Mer om författaren

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.

Innehållsförteckning

Preface. How This Book Was Written. Introduction. Modeling. Logic Simulation. Fault Modeling. Fault Simulation. Testing For Single Stuck Faults. Testing For Bridging Faults. Functional Testing. Design For Testability. Compression Techniques. Built-In Self-Test. Logic-Level Diagnosis. Self-Checking Design. PLA Testing. System-Level Diagnosis. Index.