Characterisation of Radiation Damage by Transmission Electron Microscopy
M.L Jenkins, M.A Kirk
Inbunden, 2000
3 337 kr
Characterisation of Radiation Damage by Transmission Electron Microscopy
E-bok
Engelska, 20004 674 kr
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Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
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