Brian K. Tanner – författare
Visar alla böcker från författaren Brian K. Tanner. Handla med fri frakt och snabb leverans.
11 produkter
High Resolution X-Ray Diffractometry And Topography
Av Brian K. Tanner, D.K. Bowen
E-bok, 1998
1126 kr
Lägg i varukorg
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and …
High Resolution X-Ray Diffractometry And Topography
Av D.K. Bowen, Brian K. Tanner
Häftad, 2019
1076 kr
Lägg i varukorg
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in …
Introduction to the Physics of Electrons in Solids
Inbunden, 1995
1726 kr
Lägg i varukorg
This book aims to introduce the reader to the behaviour of electrons in solids, starting with the simplest possible model, and introducing higher-level models only when the simple model is inadequate. Unlike other solid state physics texts, this book does not begin with complex crystallography, but …
Introduction to the Physics of Electrons in Solids
Häftad, 1995
813 kr
Lägg i varukorg
This book aims to introduce the reader to the behaviour of electrons in solids, starting with the simplest possible model, and introducing higher-level models only when the simple model is inadequate. Unlike other solid state physics texts, this book does not begin with complex crystallography, but …
X-Ray Metrology in Semiconductor Manufacturing
Av D. Keith Bowen, Brian K. Tanner
Inbunden, 2006
3083 kr
Lägg i varukorg
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology …
High Resolution X-Ray Diffractometry And Topography
Av D.K. Bowen, Brian K. Tanner
Inbunden, 1998
3083 kr
Lägg i varukorg
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in …
High Resolution X-Ray Diffractometry And Topography
Av Brian K. Tanner, D.K. Bowen
E-bok, 1998
1126 kr
Lägg i varukorg
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and …
X-Ray Metrology in Semiconductor Manufacturing
Av Brian K. Tanner, D. Keith Bowen
E-bok, 2018
3636 kr
Lägg i varukorg
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology …
X-Ray Metrology in Semiconductor Manufacturing
Av Brian K. Tanner, D. Keith Bowen
E-bok, 2018
3636 kr
Lägg i varukorg
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology …
X-Ray and Neutron Dynamical Diffraction
Theory and Applications
Av André Authier, Stefano Lagomarsino m. fl.
Häftad, 2012
552 kr
Lägg i varukorg
This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. …
X-Ray and Neutron Dynamical Diffraction
Theory and Applications
Av Brian K. Tanner, Stefano Lagomarsino m. fl.
E-bok, 2012
734 kr
Lägg i varukorg
This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. …
