D. Keith Bowen – författare
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3 produkter
X-Ray Metrology in Semiconductor Manufacturing
Av D. Keith Bowen, Brian K. Tanner
Inbunden, 2006
3083 kr
Lägg i varukorg
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology …
X-Ray Metrology in Semiconductor Manufacturing
Av Brian K. Tanner, D. Keith Bowen
E-bok, 2018
3636 kr
Lägg i varukorg
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology …
X-Ray Metrology in Semiconductor Manufacturing
Av Brian K. Tanner, D. Keith Bowen
E-bok, 2018
3636 kr
Lägg i varukorg
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology …
