Bokus

Edward V. Barnat – författare

Visar alla böcker från författaren Edward V. Barnat. Handla med fri frakt och snabb leverans.

3 produkter

  1. Edward V. Barnat, Toh-Ming Lu - Pulsed and Pulsed Bias Sputtering, Inbunden. Tillgänglighet: Lägg i varukorg

    Pulsed and Pulsed Bias Sputtering

    Principles and Applications

    Av Edward V. Barnat, Toh-Ming Lu

    Inbunden, 2003

    1097 kr

    Lägg i varukorg

    Diffusion Barrier Stack - 5 nm -3 nm -2 nm :. . . -. . . . : . . O. 21-lm Figure 2: Schematic representing a cross-sectional view of the topography that is encountered in the processing of integrated circuits. (Not to scale) these sub-micron sized features is depicted in Fig. 2. The role of the …

  2. Edward V. Barnat, Toh-Ming Lu - Pulsed and Pulsed Bias Sputtering, Häftad. Tillgänglighet: Lägg i varukorg

    Pulsed and Pulsed Bias Sputtering

    Principles and Applications

    Av Edward V. Barnat, Toh-Ming Lu

    Häftad, 2014

    1097 kr

    Lägg i varukorg

    Diffusion Barrier Stack - 5 nm -3 nm -2 nm :. . . -. . . . : . . O. 21-lm Figure 2: Schematic representing a cross-sectional view of the topography that is encountered in the processing of integrated circuits. (Not to scale) these sub-micron sized features is depicted in Fig. 2. The role of the …

  3. Toh-Ming Lu, Edward V. Barnat - Pulsed and Pulsed Bias Sputtering, E-bok. Tillgänglighet: Lägg i varukorg

    Pulsed and Pulsed Bias Sputtering

    Principles and Applications

    Av Toh-Ming Lu, Edward V. Barnat

    E-bok, 2013

    1459 kr

    Lägg i varukorg

    Diffusion Barrier Stack - 5 nm -3 nm -2 nm :. . . -. . . . : . . O. 21-lm Figure 2: Schematic representing a cross-sectional view of the topography that is encountered in the processing of integrated circuits. (Not to scale) these sub-micron sized features is depicted in Fig. 2. The role of the …