José Pineda de Gyvez – författare
Visar alla böcker från författaren José Pineda de Gyvez. Handla med fri frakt och snabb leverans.
10 produkter
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Av Manoj Sachdev, José Pineda de Gyvez
Inbunden, 2007
2188 kr
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Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality …
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Av Jose Pineda de Gyvez, Manoj Sachdev
E-bok, 2007
2925 kr
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Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality …
Integrated Circuit Manufacturability
The Art of Process and Design Integration
Av José Pineda de Gyvez, Dhiraj Pradhan
Inbunden, 1998
2875 kr
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"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design …
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Inbunden, 1992
1098 kr
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The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield …
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Av Manoj Sachdev, José Pineda de Gyvez
Häftad, 2010
2087 kr
Lägg i varukorg
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality …
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Häftad, 2014
1101 kr
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The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield …
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
E-bok, 2013
1427 kr
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The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield …
Low-Power High-Resolution Analog to Digital Converters
Design, Test and Calibration
Av Amir Zjajo, José Pineda de Gyvez
Inbunden, 2010
552 kr
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With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D …
Low-Power High-Resolution Analog to Digital Converters
Design, Test and Calibration
Av Jose Pineda de Gyvez, Amir Zjajo
E-bok, 2010
734 kr
Lägg i varukorg
With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D …
Low-Power High-Resolution Analog to Digital Converters
Design, Test and Calibration
Av Amir Zjajo, José Pineda de Gyvez
Häftad, 2016
552 kr
Lägg i varukorg
With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D …
