Manoj Sachdev – författare
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13 produkter
Thermal and Power Management of Integrated Circuits
Av Arman Vassighi, Manoj Sachdev
Inbunden, 2006
1097 kr
Lägg i varukorg
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and …
Thermal and Power Management of Integrated Circuits
Av Manoj Sachdev, Arman Vassighi
E-bok, 2006
1459 kr
Lägg i varukorg
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and …
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Av Manoj Sachdev, José Pineda de Gyvez
Inbunden, 2007
2187 kr
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Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality …
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Av Jose Pineda de Gyvez, Manoj Sachdev
E-bok, 2007
2925 kr
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Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality …
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Av Oleg Semenov, Hossein Sarbishaei m. fl.
Inbunden, 2008
1857 kr
Lägg i varukorg
ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor …
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Av Manoj Sachdev, Hossein Sarbishaei m. fl.
E-bok, 2008
2437 kr
Lägg i varukorg
ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor …
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Process-Aware SRAM Design and Test
Av Andrei Pavlov, Manoj Sachdev
Inbunden, 2008
1748 kr
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on …
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Process-Aware SRAM Design and Test
Av Manoj Sachdev, Andrei Pavlov
E-bok, 2008
2274 kr
Lägg i varukorg
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on …
Thermal and Power Management of Integrated Circuits
Av Arman Vassighi, Manoj Sachdev
Häftad, 2010
1095 kr
Lägg i varukorg
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and …
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Av Manoj Sachdev, José Pineda de Gyvez
Häftad, 2010
2087 kr
Lägg i varukorg
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality …
Defect Oriented Testing for CMOS Analog and Digital Circuits
E-bok, 2013
1174 kr
Lägg i varukorg
Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, …
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Av Oleg Semenov, Hossein Sarbishaei m. fl.
Häftad, 2010
1857 kr
Lägg i varukorg
ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor …
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Process-Aware SRAM Design and Test
Av Andrei Pavlov, Manoj Sachdev
Häftad, 2010
1748 kr
Lägg i varukorg
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on …
