Selahattin Sayil – författare
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9 produkter
Noise Contamination in Nanoscale VLSI Circuits
Inbunden, 2022
546 kr
Lägg i varukorg
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, …
Noise Contamination in Nanoscale VLSI Circuits
E-bok, 2022
734 kr
Lägg i varukorg
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, …
Noise Contamination in Nanoscale VLSI Circuits
Häftad, 2023
546 kr
Lägg i varukorg
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, …
Soft Error Mechanisms, Modeling and Mitigation
Inbunden, 2016
546 kr
Lägg i varukorg
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes …
Soft Error Mechanisms, Modeling and Mitigation
E-bok, 2016
734 kr
Lägg i varukorg
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes …
Contactless VLSI Measurement and Testing Techniques
Inbunden, 2017
1098 kr
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This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design …
Contactless VLSI Measurement and Testing Techniques
E-bok, 2017
1427 kr
Lägg i varukorg
This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design …
Soft Error Mechanisms, Modeling and Mitigation
Häftad, 2018
551 kr
Lägg i varukorg
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes …
Contactless VLSI Measurement and Testing Techniques
Häftad, 2018
1084 kr
Lägg i varukorg
This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design …
