Wei-Ting Kary Chien – författare
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5 produkter
Reliability, Yield, and Stress Burn-In
A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Av Way Kuo, Wei-Ting Kary Chien m. fl.
Inbunden, 1998
1636 kr
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The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date …
Reliability, Yield, and Stress Burn-In
A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Av Way Kuo, Wei-Ting Kary Chien m. fl.
Häftad, 2014
1636 kr
Lägg i varukorg
The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date …
Reliability, Yield, and Stress Burn-In
A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Av Taeho Kim, Wei-Ting Kary Chien m. fl.
E-bok, 2013
2111 kr
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The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date …
Reliability and Yield in Nanoelectronics Manufacturing
Av Wei-Ting Kary Chien, Way Kuo
Inbunden, 2026
2185 kr
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This book is a definitive guide to improving yield and reliability in the modern semiconductor industry. Blending academic research with industrial expertise, it unveils the innovative Build-In Reliability (BIR) platform.The book consists of 20 chapters, organized into four technical parts, deep …
Reliability and Yield in Nanoelectronics Manufacturing
Av Way Kuo, Wei-Ting Kary Chien
E-bok, 2026
2925 kr
Lägg i varukorg
This book is a definitive guide to improving yield and reliability in the modern semiconductor industry. Blending academic research with industrial expertise, it unveils the innovative Build-In Reliability (BIR) platform.The book consists of 20 chapters, organized into four technical parts, deep …
