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Hierarchical Modeling for VLSI Circuit TestingDebashis Bhattacharya, John P. HayesInbunden, 19891 082 kr
Del 89Hierarchical Modeling for VLSI Circuit TestingDebashis Bhattacharya, John P. HayesHäftad, 20111 082 kr
Del 115Design, Analysis and Test of Logic Circuits Under UncertaintySmita Krishnaswamy, Igor L. Markov, John P. HayesInbunden, 20121 081 kr