Young-Hee Kim – författare
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3 produkter
3 produkter
Hf-Based High-k Dielectrics
Process Development, Performance Characterization, and Reliability
Häftad, Engelska, 2007
305 kr
Skickas inom 10-15 vardagar
Hard breakdown and soft breakdown, particularly the Weibull slopes, were studied under constant voltage stress. The origin of soft breakdown (first breakdown) was studied and the results suggested that the soft breakdown may be due to one layer breakdown in the bilayer structure (HfO2/SiO2: 4 nm/4 nm).
Sozialisationsprobleme koreanischer Kinder in der Bundesrepublik Deutschland
Bedingungen und Möglichkeiten für eine interkulturelle Erziehung
Häftad, Tyska, 1986
588 kr
Skickas inom 10-15 vardagar
329 kr
Skickas inom 5-8 vardagar