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Jack C. Lee – författare

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4 produkter

  1. Arnold Zellner, Wesley O. Johnson, Jack C. Lee - Modelling and Prediction Honoring Seymour Geisser, E-bok. Tillgänglighet: Lägg i varukorg

    Modelling and Prediction Honoring Seymour Geisser

    Av Arnold Zellner, Wesley O. Johnson m. fl.

    E-bok, 2013

    734 kr

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    Modelling and Prediction Honoring Seymour Geisser contains the refereed proceedings of the Conference on Forecasting, Prediction, and Modelling held at National Chiao Tung University, Taiwan in 1994. The papers discuss general methodological issues; prediction; design of experiments and …

  2. Jack C. Lee, Wesley O. Johnson, Arnold Zellner - Modelling and Prediction Honoring Seymour Geisser, Häftad. Tillgänglighet: Lägg i varukorg

    Modelling and Prediction Honoring Seymour Geisser

    Av Jack C. Lee, Wesley O. Johnson m. fl.

    Häftad, 2012

    551 kr

    Lägg i varukorg

    Modelling and Prediction Honoring Seymour Geisser contains the refereed proceedings of the Conference on Forecasting, Prediction, and Modelling held at National Chiao Tung University, Taiwan in 1994. The papers discuss general methodological issues; prediction; design of experiments and …

  3. Young-Hee Kim, Jack C. Lee - Hf-Based High-k Dielectrics, Häftad. Tillgänglighet: Lägg i varukorg

    Hf-Based High-k Dielectrics

    Process Development, Performance Characterization, and Reliability

    Av Young-Hee Kim, Jack C. Lee

    Häftad, 2007

    312 kr

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    In this work, the reliability of HfO2 (hafnium oxide) with poly gate and dual metal gate electrode (Ru–Ta alloy, Ru) was investigated. Hard breakdown and soft breakdown, particularly the Weibull slopes, were studied under constant voltage stress. Dynamic stressing has also been used. It was found …

  4. Jack C. Lee, Young-Hee Kim - Hf-Based High-k Dielectrics, E-bok. Tillgänglighet: Lägg i varukorg

    Hf-Based High-k Dielectrics

    Process Development, Performance Characterization, and Reliability

    Av Jack C. Lee, Young-Hee Kim

    E-bok, 2022

    408 kr

    Lägg i varukorg

    In this work, the reliability of HfO2 (hafnium oxide) with poly gate and dual metal gate electrode (Ru–Ta alloy, Ru) was investigated. Hard breakdown and soft breakdown, particularly the Weibull slopes, were studied under constant voltage stress. Dynamic stressing has also been used. It was found …