Mikrochimica Acta Supplementa – serie

Investigative Methods for Determining Phases in High Speed Steels Both carbide studies and matrix studies were carried out for X-ray phase determination on the high speed steel S 6-5-2. The carbide phase was isolated chemically, the isolate yield being 10.5% by weight. The isolate was analysed and its phases investigated X-radiographically. The X-ray diagram showed that M6C carbide is to be considered the main constituent of the carbide. VC is present in small amounts. The two types of carbide in the cut surface could be distinguished metallographically by a potentiostatic etching procedure. Microprobe studies gave the composition of the two carbide types. The M6C carbide is essentially a Fe4(WMo)2C with slight V and Cr impurities in the iron group. The VC is a V-rich mixed carbide in which about 25% of Fe, Cr, Mo and W are dissolved. The proportionate amounts of M6C and VC in the isolate were determined by a balance calculation using the composition of the carbides and isolate analysis obtained with the microprobe. After corresponding conversions the results obtained were compared with the carbide-type constituents determined metallographically.The isolate was utilized as standard for X-ray determination of carbide. The calculation of the absorption coefficients necessary for X-ray deter- mination of carbides was carried out on the basis of the composition of carbide types for Cr and Mo radiation determined with the microprobe.

The 11th Colloquium on Metallurgical Analysis - a joint venture of the Institute of Analytical Chemistry of the Technical University in Vienna, the Austrian Society for Analytical Chemistry and Microchemistry, the German Metals Society (DGM), and the Society of German Iron and Steel Engineers (VDEh) - was attended by 120 scientists from 12 nations. The major topics covered were surface, micro and trace analysis of materials with a heavy emphasis on metals. According to the strategy of the meeting attention was focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and tech­ nology. Therefore progress reports on analytical techniques (like SIMS, SNMS, Positron Annihilation Spectroscopy, AES, XPS) were given as well as pre­ sentations on the development of materials (like for the fusion reactor). The majority of the discussion papers centered on the treatment of important technical problems in materials science and technology by a (mostly sophis­ ticated) combination of physical and chemical analytical techniques. The intensive exchange of ideas and results between the scientists oriented towards basic research and the industrial materials technologists was very fruitful and resulted in the establishment of several scientific cooperations. Major trends in materials analysis were also dealt with in a plenary discussion of which a short summary is contained in this volume. In order to facilitate international communication in the field of materials analysis and in view of the important questions treated in the various contri­ butions this proceedings volume was edited in English.

Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti­ tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol­ ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .

This volume treats the different methods used in electron microbeam analysis. The volume consists of five tutorial chapters which give an overview and an in-depth analysis of a particular section of electron microbeam analysis. In these chapters the state of the art technology is described together with the major obstacles which remain and a future outlook. Further, 25 brief articles are included which form the condensed scientific information of a poster session during the 2nd workshop of the European Microbeam Analysis Society held in Dubrovnik, May 1991. In this volume there are different categories of electron microbeam analysis (Electron probe microanalysis (EPMA), electron energy loss spectrometry (EELS) and Auger electron spectroscopy (AES)) intensively linked and discussed together. The versatility in the use of electron microbeams in chemical-analytical work is emphasized. The approach is strongly inititated from a methodological point of view: How are data derived and how can methods be improved further. The reliability of the particular method comes on the first place.The benefits to potential readers of this book is the state of the art overview which is enclosed in the tutorial papers and which are exemplified to some extent in the brief articles.

This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on "Modern Develop- ments and Applications in Microbeam Analysis" which took place in May 1995 in Saint Malo (France). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula- tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan- tities using different techniques: synchrotron radiation X-ray fluorescence, particle in- duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM).The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po- ster sessions. More than 80 posters were presented. Most of them gave a short oral pre- sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec- trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro- metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM).

The 19 plenary lectures and 203 poster papers presented at the 10th International Conference of Progress in Fourier Transform Spectroscopy in Budapest give an overview on the latest developments of this technology and its wide range of applications. There is information on aspects of FTS, including the latest instrumental developments, for example, in diode array detection, time resolution FTS, microscopy and spectral mapping, double modulation and two-dimensional FTS.

This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen­ tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non­ dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.