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Laung-Terng Wang – författare

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6 produkter

  1. Nur A. Touba, Charles E. Stroud, Laung-Terng Wang - System-on-Chip Test Architectures, E-bok. Tillgänglighet: Lägg i varukorg

    System-on-Chip Test Architectures

    Nanometer Design for Testability

    Av Nur A. Touba, Charles E. Stroud m. fl.

    E-bok, 2010

    815 kr

    Lägg i varukorg

    Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, …

  2. Kwang-Ting (Tim) Cheng, Yao-Wen Chang, Laung-Terng Wang - Electronic Design Automation, E-bok. Tillgänglighet: Lägg i varukorg

    Electronic Design Automation

    Synthesis, Verification, and Test

    Av Kwang-Ting (Tim) Cheng, Yao-Wen Chang m. fl.

    E-bok, 2009

    962 kr

    Lägg i varukorg

    This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, …

  3. Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen - VLSI Test Principles and Architectures, Inbunden. Tillgänglighet: Lägg i varukorg

    VLSI Test Principles and Architectures

    Design for Testability

    Av Laung-Terng Wang, Cheng-Wen Wu m. fl.

    Inbunden, 2006

    854 kr

    Lägg i varukorg

    This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of …

  4. Laung-Terng Wang, Charles E. Stroud, Nur A. Touba - System-on-Chip Test Architectures, Inbunden. Tillgänglighet: Lägg i varukorg

    System-on-Chip Test Architectures

    Nanometer Design for Testability

    Av Laung-Terng Wang, Charles E. Stroud m. fl.

    Inbunden, 2008

    803 kr

    Lägg i varukorg

    Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, …

  5. Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting (Tim) Cheng - Electronic Design Automation, Inbunden. Tillgänglighet: Lägg i varukorg

    Electronic Design Automation

    Synthesis, Verification, and Test

    Av Laung-Terng Wang, Yao-Wen Chang m. fl.

    Inbunden, 2009

    1034 kr

    Lägg i varukorg

    This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, …

  6. Laung-Terng Wang, Cheng-Wen Wu - VLSI Test Principles and Architectures: Design for Testability, Häftad. Tillgänglighet: Lägg i varukorg

    VLSI Test Principles and Architectures: Design for Testability

    Av Laung-Terng Wang, Cheng-Wen Wu

    Häftad, 2006

    713 kr

    Lägg i varukorg