Martin Gall – författare
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4 produkter
Electromigration in Metals
Fundamentals to Nano-Interconnects
Av Valeriy Sukharev, Martin Gall m. fl.
E-bok, 2022
1337 kr
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Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. …
Electromigration in Metals
Fundamentals to Nano-Interconnects
Av Paul S. Ho, Chao-Kun Hu m. fl.
Inbunden, 2022
1143 kr
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Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. …
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics - 2009: Volume 1156
Volume 1156
Av Martin Gall, Alfred Grill m. fl.
Häftad, 2014
471 kr
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Enabled by the development and introduction of new materials, the semiconductor industry continues to follow Moore's law into 32nm and 22nm technologies. Advanced interconnect structures require the use of porous dielectrics with further reduced k-values and even weaker mechanical properties, as …
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics - 2009: Volume 1156
Av Martin Gall, Alfred Grill m. fl.
Inbunden, 2009
1693 kr
Lägg i varukorg
Enabled by the development and introduction of new materials, the semiconductor industry continues to follow Moore's law into 32nm and 22nm technologies. Advanced interconnect structures require the use of porous dielectrics with further reduced k-values and even weaker mechanical properties, as …
