Chao-Kun Hu – författare
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2 produkter
Electromigration in Metals
Fundamentals to Nano-Interconnects
Av Valeriy Sukharev, Martin Gall m. fl.
E-bok, 2022
1337 kr
Lägg i varukorg
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. …
Electromigration in Metals
Fundamentals to Nano-Interconnects
Av Paul S. Ho, Chao-Kun Hu m. fl.
Inbunden, 2022
1143 kr
Lägg i varukorg
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. …