GaN Transistor Modeling for RF and Power Electronics

Yogesh Singh Chauhan is a Chair Professor in the Department of Electrical Engineering at the Indian Institute of Technology Kanpur, India. He is the developer of several industry standard models: ASM-HEMT, BSIM-BULK (formerly BSIM6), BSIM-CMG, BSIM-IMG, BSIM4 and BSIM-SOI models. His research group is involved in developing compact models for GaN transistors, FinFET, nanosheet/gate-all-around FETs, FDSOI transistors, negative capacitance FETs and 2D FETs. His research interests are RF characterization, modeling, and simulation of semiconductor devices.Ahtisham Ul Haq Pampori is a postdoctoral researcher at the Berkeley Device Modeling Center (BDMC), University of California, Berkeley. His research focuses on developing advanced semiconductor device models, particularly next-generation BSIM models for field-effect transistors. He earned his doctorate from the Indian Institute of Technology Kanpur, with a focus on GaN HEMT RF device characterization and modeling. A recipient of the Prime Minister’s Research Fellowship, Ahtisham has extensive industry experience collaborating on GaN HEMT characterization and modeling. Prior to academia, he was an Associate Consultant at Frost & Sullivan, specializing in Cloud and Big Data. Sheikh Aamir Ahsan possesses expertise in state-of-the-art RF and power GaN SPICE models. Originating from the development of the ASM GaN model during his doctoral studies at IIT Kanpur, presently serving as an Assistant Professor at the National Institute of Technology Srinagar (NITSRI), his team leads the advancement of power GaN technology through modeling and design enablement frameworks. Acting as a consultant for multiple industrial partners, his impact extends beyond academia, as his GaN research seamlessly integrates into commercial SPICE simulators, influencing the trajectory of GaN product development and application globally. He was awarded the Startup Research Grant in 2019 by the Science and Engineering Research Board, India.

• Part I: Introduction 1. GaN Device Physics 2. GaN HEMT Models Part II: ASM-HEMT Model 3. Surface Potential, 2DEG, and Drain Current Model 4. Self-Heating and Temperature Effects 5. Noise and Gate Current Part III: ASM-HEMT for GaN Power Electronics 6. GaN Power Device Characterization 7. Terminal Charges and Capacitances 8. TCAD Simulation 9. Switching Collapse Part IV: ASM-HEMT for GaN RF Electronics 10. Characterization of RF GaN HEMTs 11. RF Modeling-I 12. RF Modeling-II Part V: Miscellaneous 13. Parameter Extraction 14. Model Quality Testing