This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals
Charles S. Barrett, Conference on Applications of X-Ray Anal, Charles S. Barrett, J.V. Gilfrich, Ron Jenkins, John C. Russ, J.W. Richardson Jr., Paul K. Predecki
I. C. Noyan, T. C. Huang, John V. Gilfrich, I. Cev Noyan, Ron Jenkins, Ting C. Huang, Robert L. Snyder, Deane K. Smith, Mary Ann Zaitz, Paul K. Predecki