Advances in X-Ray Analysis

Volume 35B

AvC.S. Barrett,John V. Gilfrich

Häftad, Engelska, 2012

536 kr

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Produktinformation

Utgivningsdatum:2012-11-21
Mått:170 x 244 x 35 mm
Vikt:1 100 g
Format:Häftad
Språk:Engelska
Antal sidor:641
Förlag:Springer-Verlag New York Inc.
ISBN:9781461365327

Utforska kategorier

Innehållsförteckning

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

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