Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Häftad, Engelska, 2011

Del i serien SpringerBriefs in Electrical and Computer Engineering

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Beskrivning

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

Produktinformation

Utgivningsdatum:2011-09-22
Mått:155 x 235 x 7 mm
Vikt:178 g
Format:Häftad
Språk:Engelska
Serie:SpringerBriefs in Electrical and Computer Engineering
Antal sidor:89
Upplaga:2012
Förlag:Springer-Verlag New York Inc.
ISBN:9781441995476

Utforska kategorier

Innehållsförteckning

Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.