Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Mohammed Ismail, Sleiman Bou-Sleiman
E-bok
2011718 kr
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
AvSleiman Bou-Sleiman,Mohammed Ismail
Häftad, Engelska, 2011
556 kr
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Beskrivning
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Mohammed Ismail, Sleiman Bou-Sleiman
E-bok
2011718 kr
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