Secondary Ion Mass Spectrometry

Applications for Depth Profiling and Surface Characterization

AvFred Stevie

Häftad, Engelska, 2015

Del i serien Materials Characterization and Analysis Collection

758 kr

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Beskrivning

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

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