Materials Characterization and Analysis Collection – serie
Visar alla böcker i serien Materials Characterization and Analysis Collection. Handla med fri frakt och snabb leverans.
8 produkter
Secondary Ion Mass Spectrometry
Applications for Depth Profiling and Surface Characterization
Av Fred Stevie
Häftad, 2015
791 kr
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This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace …
Auger Electron Spectroscopy
Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films
Häftad, 2015
791 kr
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This book discusses the use of Auger electron spectroscopy (AES) and scanning Auger microscopy for the characterization of a wide range of technological materials, including, metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging …
Practical Guide to Transmission Electron Microscopy, Volume 1
Fundamentals
Av Zhiping Luo
Häftad, 2015
791 kr
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Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, …
Spectroscopic Ellipsometry
Practical Application to Thin Film Characterization
Av Harland G. Tompkins, James N. Hilfiker
Häftad, 2015
525 kr
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Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced …
Practice of TOF-SIMS
Time of Flight Secondary Ion Mass Spectrometry
Häftad, 2016
791 kr
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Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a …
Practical Guide to Transmission Electron Microscopy, Volume II
Advanced Microscopy
Av Zhiping Luo
Häftad, 2015
791 kr
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Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, …
X-Ray Fluorescence Spectrometry and Its Applications to Archaeology
An Illustrated Guide
Av Mary Kate Donais, David B. George
Häftad, 2018
525 kr
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This book serves as a practical guide for applications of X-ray fluorescence spectrometry, a nondestructive elemental analysis technique, to the study and understanding of archaeology. Descriptions of XRF theory and instrumentation and an introduction to field applications and practical aspects of …
Raman Spectroscopy, Volume I
Principles and Applications in Chemistry, Physics, Materials Science, and Biology
Häftad, 2019
525 kr
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The book provides an up-to-date overview of the fast growing area of Raman spectroscopy.The two-volume work describes how analytic methods using Raman spectroscopy allow for the chemical analysis of materials, providing even spatial resolution without precedent. In addition, external perturbations …
