James N. Hilfiker – författare
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1 produkter
Spectroscopic Ellipsometry
Practical Application to Thin Film Characterization
Av Harland G. Tompkins, James N. Hilfiker
Häftad, 2015
525 kr
Lägg i varukorg
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced …
