Alan M. Spool – författare

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1 produkter

1. 

   Practice of TOF-SIMS

   Time of Flight Secondary Ion Mass Spectrometry

   Av Alan M. Spool

   Häftad, 2016

   791 kr

   Lägg i varukorg

   Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a …