Fred Stevie – författare

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1 produkter

1. 

   Secondary Ion Mass Spectrometry

   Applications for Depth Profiling and Surface Characterization

   Av Fred Stevie

   Häftad, 2015

   791 kr

   Lägg i varukorg

   This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace …