Sung-Mo (Steve) Kang – författare
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15 produkter
Electrothermal Analysis of VLSI Systems
Av Sung-Mo (Steve) Kang, Chin-Chi Teng m. fl.
E-bok, 2005
1459 kr
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Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device …
Electrothermal Analysis of VLSI Systems
Av Yi-Kan Cheng, Ching-Han Tsai m. fl.
Inbunden, 2000
1094 kr
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Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device …
Design Automation for Timing-Driven Layout Synthesis
Av S. Sapatnekar, Sung-Mo (Steve) Kang
Inbunden, 1992
1637 kr
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The automation of layout synthesis design under stringent timing specifications is essential for state-of-the-art VLSI circuits and systems design. Especially, the timing-driven layout synthesis with optimal placement and routing of transistors with proper sizing is most critical in view of the …
Hot-Carrier Reliability of MOS VLSI Circuits
Av Yusuf Leblebici, Sung-Mo (Steve) Kang
Inbunden, 1993
2180 kr
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This volume addresses the issues related to hot-carrier reliability of MOS VLSI circuits, ranging from device physics to circuit design guidelines. It presents a unified view of the physical mechanisms involved in hot-carrier induced device degradation, the prevalent models for these mechanisms, …
Physical Design for Multichip Modules
Av Mysore Sriram, Sung-Mo (Steve) Kang
Inbunden, 1994
1637 kr
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Physical Design for Multichip Modules collects together a large body of important research work that has been conducted in recent years in the area of Multichip Module (MCM) design. The material consists of a survey of published results as well as original work by the authors. All major aspects of …
Modeling of Electrical Overstress in Integrated Circuits
Av Carlos H. Diaz, Sung-Mo (Steve) Kang m. fl.
Inbunden, 1994
1637 kr
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Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents …
Physical Design for Multichip Modules
Av Mysore Sriram, Sung-Mo (Steve) Kang
Häftad, 2012
1639 kr
Lägg i varukorg
Physical Design for Multichip Modules collects together a large body of important research work that has been conducted in recent years in the area of Multichip Module (MCM) design. The material consists of a survey of published results as well as original work by the authors. All major aspects of …
Modeling of Electrical Overstress in Integrated Circuits
Av Carlos H. Diaz, Sung-Mo (Steve) Kang m. fl.
Häftad, 2012
1639 kr
Lägg i varukorg
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents …
Design Automation for Timing-Driven Layout Synthesis
Av S. Sapatnekar, Sung-Mo (Steve) Kang
Häftad, 2012
1639 kr
Lägg i varukorg
Moore's law [Noy77], which predicted that the number of devices in tegrated on a chip would be doubled every two years, was accurate for a number of years. Only recently has the level of integration be gun to slow down somewhat due to the physical limits of integration technology. Advances in …
Hot-Carrier Reliability of MOS VLSI Circuits
Av Yusuf Leblebici, Sung-Mo (Steve) Kang
Häftad, 2012
2183 kr
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As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis …
Physical Design for Multichip Modules
Av Sung-Mo (Steve) Kang, Mysore Sriram
E-bok, 2012
2111 kr
Lägg i varukorg
Physical Design for Multichip Modules collects together a large body of important research work that has been conducted in recent years in the area of Multichip Module (MCM) design. The material consists of a survey of published results as well as original work by the authors. All major aspects of …
Modeling of Electrical Overstress in Integrated Circuits
Av Charvaka Duvvury, Sung-Mo (Steve) Kang m. fl.
E-bok, 2012
2111 kr
Lägg i varukorg
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents …
Design Automation for Timing-Driven Layout Synthesis
Av Sung-Mo (Steve) Kang, S. Sapatnekar
E-bok, 2012
2111 kr
Lägg i varukorg
Moore''s law [Noy77], which predicted that the number of devices in tegrated on a chip would be doubled every two years, was accurate for a number of years. Only recently has the level of integration be gun to slow down somewhat due to the physical limits of integration technology. Advances in …
Hot-Carrier Reliability of MOS VLSI Circuits
Av Sung-Mo (Steve) Kang, Yusuf Leblebici
E-bok, 2012
2925 kr
Lägg i varukorg
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis …
Electrothermal Analysis of VLSI Systems
Av Yi-Kan Cheng, Ching-Han Tsai m. fl.
Häftad, 2013
1095 kr
Lägg i varukorg
Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device …
