Carlos H. Diaz – författare
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3 produkter
Modeling of Electrical Overstress in Integrated Circuits
Av Carlos H. Diaz, Sung-Mo (Steve) Kang m. fl.
Inbunden, 1994
1637 kr
Lägg i varukorg
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents …
Modeling of Electrical Overstress in Integrated Circuits
Av Carlos H. Diaz, Sung-Mo (Steve) Kang m. fl.
Häftad, 2012
1639 kr
Lägg i varukorg
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents …
Modeling of Electrical Overstress in Integrated Circuits
Av Charvaka Duvvury, Sung-Mo (Steve) Kang m. fl.
E-bok, 2012
2111 kr
Lägg i varukorg
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents …
