"This book can be taken as an introduction to the people who may not be familiar with these issues. It also provides some promotion to further research activities in this area." Pixin Zhang European Journal of Mechanics, 1994

• Part 1 Knowledge-based statistical approach: chronological equipment diagnosis using evidence integration, N. Chang and C. Spanos; process control system for VLSI fabrication, E. Sachs et al. Part 2 Model-based approach: model-based plant diagnosis and control expert system, J. Suzuki et al; knowledge representation for multiple fault resolution and corrective action planning in chemical diagnosis, J. McDowell and J. Davies. Part 3 Machine learning and neural network approach: intelligent diagnosis systems for manufacturing using abductive technology, G. Mongermory et al; a connectionist approach to diagnostic problem solving, Y. Peng and J. Reggia; and others.

"This book can be taken as an introduction to the people who may not be familiar with these issues. It also provides some promotion to further research activities in this area." Pixin Zhang European Journal of Mechanics, 1994

• Part 1 Knowledge-based statistical approach: chronological equipment diagnosis using evidence integration, N. Chang and C. Spanos; process control system for VLSI fabrication, E. Sachs et al. Part 2 Model-based approach: model-based plant diagnosis and control expert system, J. Suzuki et al; knowledge representation for multiple fault resolution and corrective action planning in chemical diagnosis, J. McDowell and J. Davies. Part 3 Machine learning and neural network approach: intelligent diagnosis systems for manufacturing using abductive technology, G. Mongermory et al; a connectionist approach to diagnostic problem solving, Y. Peng and J. Reggia; and others.

"This book can be taken as an introduction to the people who may not be familiar with these issues. It also provides some promotion to further research activities in this area." Pixin Zhang European Journal of Mechanics, 1994

• Part 1 Knowledge-based statistical approach: chronological equipment diagnosis using evidence integration, N. Chang and C. Spanos; process control system for VLSI fabrication, E. Sachs et al. Part 2 Model-based approach: model-based plant diagnosis and control expert system, J. Suzuki et al; knowledge representation for multiple fault resolution and corrective action planning in chemical diagnosis, J. McDowell and J. Davies. Part 3 Machine learning and neural network approach: intelligent diagnosis systems for manufacturing using abductive technology, G. Mongermory et al; a connectionist approach to diagnostic problem solving, Y. Peng and J. Reggia; and others.