Angus I Kirkland – författare

Chemical characterisation techniques have been essential tools in underpinning the explosion in nanotechnology in recent years and nanocharacterisation is a rapidly developing field. Contributions in this book from leading teams across the globe provide an overview of the different microscopic techniques now in regular use for the characterisation of nanostructures. Essentially a handbook to all working in the field this indispensable resource provides a survey of microscopy based techniques with experimental procedures and extensive examples of state of the art characterisation methods including, Transmission Electron Microscopy, Electron Tomography, Tunneling Microscopy, Electron Holography, Electron Energy Loss Spectroscopy This timely publication will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.

Electron microscopes are used in most investigation methods in materials science and are key players in the rise of nanotechnology. As the limits of electron microscopy are being pushed by the development of much-improved electron sources and electron optics, the attention of the electron microscopy community is turning towards imaging electron detectors, but the literature on this complex field is limited and extremely fragmented. This book provides a comprehensive introduction to electron detectors, bringing together the most important achievements and highlighting the most important advances. It discusses theoretical, technological and functional aspects of electron detectors, building a natural progression through the main concepts in detection as well as providing an excellent resource for teaching and for new researchers in electron microscopy. The book also presents a critical outline of the new generation of electron detectors, which highlights the latest breakthroughs and illustrates how these will further push the limits of electron microscopy.

Electron microscopes are used in most investigation methods in materials science and are key players in the rise of nanotechnology. As the limits of electron microscopy are being pushed by the development of much-improved electron sources and electron optics, the attention of the electron microscopy community is turning towards imaging electron detectors, but the literature on this complex field is limited and extremely fragmented. This book provides a comprehensive introduction to electron detectors, bringing together the most important achievements and highlighting the most important advances. It discusses theoretical, technological and functional aspects of electron detectors, building a natural progression through the main concepts in detection as well as providing an excellent resource for teaching and for new researchers in electron microscopy. The book also presents a critical outline of the new generation of electron detectors, which highlights the latest breakthroughs and illustrates how these will further push the limits of electron microscopy.