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Charles Cohn, Charles Harper - Failure-Free Integrated Circuit Packages, Inbunden

Inbunden, Engelska, 2004

Failure-Free Integrated Circuit Packages

Av Charles Cohn, Charles Harper

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Beskrivning
Spot, stop, and analyze IC device failure with this unique illustrated guide. Worth more than a thousand words, each illustration in "Failure- Free Integrated Circuit Packages" gives you a visual reference on common failure modes of IC devices in organic packages. In addition, the wide knowledge base of the chapter authors provides you with proven, leading-edge failure analysis techniques. "Failure-Free Integrated Circuit Packages" helps you: find, identify, and correct potential failures before they occur; improve device reliability; learn from case studies of IC package failure modes; quickly locate failures through visual comparisons; apply state-of-the-art failure analysis techniques; comprehend the physics behind the failure mechanism; and, understand the limitations of reliability testing and lifetime estimation.Inside, you'll find a practical and easy way to approach failure analysis of IC's in organic packages.Areas covered include: fundamentals of IC package technologies; reliability; physics and chemistry of failures in packaged devices; strategies for locating failures; failure analysis techniques; failure modes common in organic IC packages; and, emerging assembly materials for IC packaging.
Produktinformation
  • Utgivningsdatum: 2004-09-16
  • Mått: 157 x 231 x 33 mm
  • Vikt: 675 g
  • Format: Inbunden
  • Språk: Engelska
  • Antal sidor: 366
  • Förlag: McGraw-Hill Education
  • ISBN: 9780071434843
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