Advances in Imaging and Electron Physics

Theory of Intense Beams of Charged Particles

AvUnknown,Peter W. Hawkes

Inbunden, Engelska, 2011

Del 166 i serien Advances in Imaging and Electron Physics

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Beskrivning

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Contributions from leading international scholars and industry experts
Discusses hot topic areas and presents current and future research trends
Invaluable reference and guide for physicists, engineers and mathematicians

Produktinformation

Utgivningsdatum:2011-07-28
Mått:152 x 229 x 50 mm
Vikt:1 110 g
Format:Inbunden
Språk:Engelska
Serie:Advances in Imaging and Electron Physics
Antal sidor:752
Förlag:Elsevier Science
ISBN:9780123813107

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Mer om författaren

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Innehållsförteckning

Beam equationsExact solutions to the beam equationsAnti-paraxial expansionsSolution of the beam formation problem in 3D caseAsymptotic theory of 3D flowsGeometrized theoryExamples of applications