Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

• Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique IncidenceG. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. UttenweilerThermal Imaging in MedicineLila Iznita Izhar and Maria PetrouDerivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A ReviewJean-Michel TualleImaging Mass Spectrometry – Sample Preparation, Instrumentation and ApplicationsKamlesh Shrivas and Mitsutoshi SetouTransformation OpticsRobert T. Thompson and Steven A. CummerTSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its ApplicationsTobias Klein, Egbert Buhr and Carl Georg FraseLogarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

• Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique IncidenceG. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. UttenweilerThermal Imaging in MedicineLila Iznita Izhar and Maria PetrouDerivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A ReviewJean-Michel TualleImaging Mass Spectrometry – Sample Preparation, Instrumentation and ApplicationsKamlesh Shrivas and Mitsutoshi SetouTransformation OpticsRobert T. Thompson and Steven A. CummerTSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its ApplicationsTobias Klein, Egbert Buhr and Carl Georg FraseLogarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah