Electron and Ion Microscopy and Microanalysis

Principles and Applications, Second Edition,

Häftad, Engelska, 2019

988 kr

Beställningsvara. Skickas inom 10-15 vardagar. Fri frakt över 249 kr.

Beskrivning

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Produktinformation

Utgivningsdatum:2019-10-29
Mått:178 x 254 x 45 mm
Vikt:453 g
Format:Häftad
Språk:Engelska
Antal sidor:856
Upplaga:2
Förlag:Taylor & Francis Ltd
ISBN:9780367402945

Utforska kategorier

Fysik inom Naturvetenskap och teknik

Mer om författaren

Lawrence E. Murr

Innehållsförteckning

CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.