Electron and Ion Microscopy and Microanalysis

Principles and Applications, Second Edition,

Häftad, Engelska, 2019

995 kr

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Beskrivning

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Produktinformation

Utgivningsdatum:2019-10-29
Mått:178 x 254 x 45 mm
Vikt:453 g
Format:Häftad
Språk:Engelska
Antal sidor:856
Upplaga:2
Förlag:Taylor & Francis Ltd
ISBN:9780367402945

Utforska kategorier

Fysik inom Naturvetenskap och teknik

Mer om författaren

Lawrence E. Murr

Innehållsförteckning

CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.