"For graduate students in their disciplines, physicists, chemists, and material scientists and engineers set out the basic concepts of selected techniques for characterizing the heterostructures and nanostructures of semiconductors. The second part of each chapter presents example findings of the technique described in the recent literature." --Reference and Research Book News, October 2013

• Chapter 1. Introduction (C. Lamberti)Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni)Chapter 3. Electrical and optical properties of heterostructures (TBC)Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi)Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo)Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli)Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo)Chapter 8. Raman Spectroscopy (D. Wolverson)Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini)Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schülli)Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier)Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo)Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev)

"For graduate students in their disciplines, physicists, chemists, and material scientists and engineers set out the basic concepts of selected techniques for characterizing the heterostructures and nanostructures of semiconductors. The second part of each chapter presents example findings of the technique described in the recent literature." --Reference and Research Book News, October 2013

• Chapter 1. Introduction (C. Lamberti)Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni)Chapter 3. Electrical and optical properties of heterostructures (TBC)Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi)Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo)Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli)Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo)Chapter 8. Raman Spectroscopy (D. Wolverson)Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini)Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schülli)Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier)Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo)Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev)

"For graduate students in their disciplines, physicists, chemists, and material scientists and engineers set out the basic concepts of selected techniques for characterizing the heterostructures and nanostructures of semiconductors. The second part of each chapter presents example findings of the technique described in the recent literature." --Reference and Research Book News, October 2013

• Chapter 1. Introduction (C. Lamberti)Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni)Chapter 3. Electrical and optical properties of heterostructures (TBC)Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi)Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo)Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli)Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo)Chapter 8. Raman Spectroscopy (D. Wolverson)Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini)Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schülli)Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier)Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo)Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev)