Ionizing Radiation Effects in MOS Devices and Circuits

Inbunden, Engelska, 1989

3 990 kr

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Beskrivning

The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.

Produktinformation

Utgivningsdatum:1989-06-07
Mått:169 x 245 x 34 mm
Vikt:962 g
Format:Inbunden
Språk:Engelska
Antal sidor:608
Förlag:John Wiley & Sons Inc
ISBN:9780471848936

Utforska kategorier

Elektronik och kommunikationer inom Naturvetenskap och teknik

Mer om författaren

T. P. Ma and Paul V. Dressendorfer are the authors of Ionizing Radiation Effects in MOS Devices and Circuits, published by Wiley.

Innehållsförteckning

Historical Perspective (H. Hughes). Electron-Hole Generation, Transport, and Trapping in SiO2 (F.McLean, et al.). Radiation-Induced Interface Traps (P. Winokur). Radiation Effects on MOS Devices and Circuits (P.Dressendorfer). Radiation-Hardening Technology (P. Dressendorfer). Process-Induced Radiation Effects (T. Ma). Source Considerations and Testing Techniques (K. Kerris). Transient-Ionization and Single-Event Phenomena (S. Kerns). Index.

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