• Fri frakt över 249 kr
  • •
  • Snabba leveranser
  • •
  • Billiga böcker
Kundservice

Du är på sajten för privatpersoner.

Företag, bibliotek eller offentlig verksamhet?

Du handlar på classic.bokus.com, där alla dina funktioner finns intakta.
Till classic.bokus.com
Bokus logotyp. Gå till startsidan.
  • Erbjudanden
  • Student
  • Topplistor
  • Barn & ungdom
  • Bokus Play
  • E-böcker
  • Ljudböcker
  • Pocketböcker
  • Spel och pussel

Pocketfynda! Hundratals böcker för 49 kr/st →

Sidfot

Mina sidor

    Hjälp

    • Kundservice
    • Vanliga frågor och svar
    • Frakt och leverans
    • Retur vid ångerrätt
    • Reklamera vara
    • Betalning
    • Köpvillkor
    • Allmänna villkor
    • Information om webbplatsens tillgänglighet

    Om Bokus

    • Om oss
    • Pressrum
    • För studenter
    • För företag
    • För bibliotek och offentlig verksamhet
    • För leverantörer
    • Hållbarhet

    Populärt

    • Aktuella erbjudanden
    • Presentkort
    • Studentlitteratur
    • Nya böcker
    • Topplistor
    • Signerade böcker
    • Engelska böcker

    Inspiration

    • Boktips
    • BookTok
    • Barnbokskaraktärer
    • Populära författare
    Logotyp för Bokus
    Följ oss på Facebook (extern länk)Följ oss på Instagram (extern länk)Följ oss på YouTube (extern länk)Följ oss på TikTok (extern länk)
    bokus @ CookiesAnpassa cookiesIntegritetspolicyKöpvillkor
    Till Citymail hemsida (extern länk)Till Budbee hemsida (extern länk)Till Postnord hemsida (extern länk)Till Schenker hemsida (extern länk)Till Early Bird hemsida (extern länk)Till Walleys hemsida (extern länk)
    1. Naturvetenskap och teknik
    2. Matematik och naturvetenskap
    3. Matematik
    4. Matematisk statistik

    Scan Statistics

    Methods and Applications

    AvJoseph Glaz,Vladimir Pozdnyakov

    Inbunden, Engelska, 2009

    Del i serien Statistics for Industry and Technology

    1 614 kr

    Beställningsvara. Skickas inom 10-15 vardagar. Fri frakt över 249 kr.

    Beskrivning

    Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. The chapters are written by leading experts in the field of scan statistics. Key features include many current results and new directions for future research; challenging theoretical methodological research problems; presentation accessible to both statisticians and scientists from other disciplines where scan statistics are employed; emphasis on real-world applications to areas such as bioinformatics and biosurveillance; and extensive references to research articles, books, and relevant computer software.Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.

    Produktinformation

    • Utgivningsdatum:2009-05-28
    • Mått:178 x 254 x 24 mm
    • Vikt:950 g
    • Format:Inbunden
    • Språk:Engelska
    • Serie:Statistics for Industry and Technology
    • Antal sidor:394
    • Upplaga:2009
    • Förlag:Birkhauser Boston Inc
    • ISBN:9780817647483

    Utforska kategorier

    • Matematisk statistik inom Naturvetenskap och teknik

    Recensioner i media

    From the reviews: "The area of scan statistics has developed rapidly in recent years. ... provided excellent overviews of the area. ... There are many papers of interest here for the readers of Technometrics. ... This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified." (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)

    Innehållsförteckning

    • Joseph Naus: Father of the Scan Statistic.- Precedence-Type Tests for the Comparison of Treatments with a Control.- Extreme Value Results for Scan Statistics.- Boundary Crossing Probability Computationsin the Analysis of Scan Statistics.- Approximations for Two-Dimensional Variable Window Scan Statistics.- Applications of Spatial Scan Statistics: A Review.- Extensions of the Scan Statistic for the Detection and Inference of SpatialClusters.- 1-Dependent Stationary Sequences and Applications to Scan Statistics.- Scan Statistics in Genome-Wide Scan for Complex Trait Loci.- On Probabilities for Complex Switching Rules in Sampling Inspection.- Bayesian Network Scan Statistics for Multivariate Pattern Detection.- ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response.- False Discovery Control for Scan Clustering.- Martingale Methods for Patterns and Scan Statistics.- How Can Pattern Statistics Be Useful for DNA Motif Discovery?.- Occurrence of Patterns and Motifs in Random Strings.- Detection of Disease Clustering.